Transient Error Data Analysis.

Abstract

Experimental data on transient faults from several digital computer systems are presented and analyzed. This research is significant because earlier work on validation of reliability models has concentrated only on permanent faults. The systems for which data have been collected are the DEC PDP-10 series computers, the Cm multiprocessor, and the C.vmp fault tolerant microprocessor. Current results show that transient faults do not occur with constant failure rates as has been commonly assumed. Instead, the data for all three systems indicate Weibull distributions with decreasing failure rates. Additional keywords: data acquisition; Weibull density functions; charts goodness of fit test; chi square method. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1979
Accession Number
ADA155395

Entities

People

  • D. P. Mcconnel
  • M. M. Tsao
  • S. R. Siewiorek

Organizations

  • Carnegie Mellon University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Computational Science
  • Computer Science
  • Computers
  • Data Analysis
  • Data Mining
  • Data Science
  • Goodness Of Fit Tests
  • Information Processing
  • Information Science
  • Linear Regression Analysis
  • Network Science
  • Probability Density Functions
  • Regression Analysis
  • Reliability
  • Statistical Analysis
  • Statistical Tests
  • Statistics

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Mathematics or Statistics