A Methodology for the Design of Testable Custom Large-Scale Integrated Circuits.

Abstract

This report summarizes the main concepts in the design for testability of custom large-scale integrated circuits (CLSICs) and concepts involved in testing for physical faults in actual hardware. Important problems and issues which should be considered in designing a testable CLSIC, including test structures and design style, test strategies, test strategy measures, and testable design methodologies are introduced. A general methodology for designing a testable CLSIC is presented, which includes partitioning a chip into circuit structures, and imbedding each circuit structure into a suitable testable design structure. Measures are introduced so that different test methodologies can be quantitatively compared. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 31, 1985
Accession Number
ADA156098

Entities

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Autonomy

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuit Boards
  • Circuit Testers
  • Circuits
  • Computer Science
  • Computer-Aided Design
  • Computers
  • Digital Circuits
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Large Scale Integrated Circuits
  • Logic Gates
  • Networks
  • Semiconductors
  • Test Equipment
  • Test Methods
  • Test Sets

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Materials Science (Mechanical Engineering).
  • Software Engineering