Design of a Microprogram Control Unit with Concurrent Error Detection.

Abstract

This paper presents an integrated approach to the design of a microprogram control unit (MCU) with concurrent error detection (CED) capability for errors generated by VLSI physical failures. The paper first presents the design of a single-chip MCU that comprehensively detects errors due to internal physical failures during its normal operation. The AM2910 microprogram sequencer is used as a functional model for the CED MCU. Lastly, the paper presents a critical evaluation of the actual mask-level layout of the CED MCU design versus a simplex MCU without CED and a CED MCU through duplication and comparison. Additional keywords: Fault tolerant computing; Control systems; Integrated circuits; Bus conductors. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1984
Accession Number
ADA156447

Entities

People

  • M. M. Yen

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Classification
  • Coding
  • Computer Programming
  • Computers
  • Control Systems
  • Decoding
  • Detection
  • Electrical Engineering
  • Fault Tolerance
  • Fault Tolerant Computing
  • Generators
  • Instruction Set Architecture
  • New York
  • Security
  • Simulations
  • Simulators
  • Test And Evaluation

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Regression Analysis.