Microcircuit Device Reliability Field Experience Database. Volume 1. Field Data. Volume 2. Failure Event/Analysis Data.

Abstract

MDR-21a is a Structured presentation of Field Experience Reliability Data which covers Digital, Linar, Interface, Memory and VLSI Device Types. Keywords: Digital Integrated Ciruits; Linear Integrated Circuits; Interface Integrated Circuits; Memory Integrated Circuits; V.L.S.I. Integrated Circuits; and Field Experience.

Document Details

Document Type
Technical Report
Publication Date
Feb 11, 1985
Accession Number
ADA156836

Entities

People

  • D. J. Mahar
  • M. J. Rossi

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Databases
  • Electronics
  • Integrated Circuits
  • Microcircuits
  • Networks
  • Reliability

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Parallel and Distributed Computing.

Technology Areas

  • Microelectronics