Mechanisms of Excitation and Ionization Processes in Sputtering.

Abstract

The primary objective of our research project is to understand the basic mechanisms governing the inelastic outershell processes, i.e. excitation, ionization and neutralization, in particle-solid interactions. To this end, we direct our investigation of the particles sputtered when a solid surface is subjected to energetic ion bombardment. An understanding of the basic mechanisms will allow better interpretation of experimental data obtained by surface analytical techniques which make use of sputtering such as secondary ion mass spectrometry (SIMS), Auger electron spectrometry (AES) and x-ray photoemission spectrometry (XPS). These techniques are commonly used to study microelectronics problems concerning interfairal properties and diffusion of dopants and impurities. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 07, 1985
Accession Number
ADA158061

Entities

People

  • I. S. T. Tsong

Organizations

  • Arizona State University

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Auger Electrons
  • Electrons
  • Excitation
  • Experimental Data
  • Free Electrons
  • Ion Bombardment
  • Ionization
  • Ions
  • Mass Spectra
  • Mass Spectrometry
  • Military Research
  • Molecules
  • Particles
  • Spectra
  • Spectrometry
  • Spectroscopy
  • Sputtering

Readers

  • Molecular Photonics/Laser Physics
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene