Precision Interferometric Dilatometer

Abstract

An improved double Michelson laser interferometric dilatometer with an inexpensive automatic signal processor is described. The unit is suitable for studying materials having near-zero coefficients of thermal expansion (CTE) ranging from 100 to >450 K. Delta L/L values to a resolution of less than 10 to the minus 7th power and instantaneous CTE values (to less than 10 to the minus 8th power per K) can be plotted in real time at regular intervals (>30 s) to give time-related absolute expansion data of noncontacted samples of arbitrary shape or size. Keywords: Dilatometry; Michelson interferometry; Signal processing; Thermal expansion.

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Document Details

Document Type
Technical Report
Publication Date
Aug 12, 1985
Accession Number
ADA158684

Entities

People

  • E. G. Wolff
  • R. C. Savedra

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Composite Materials
  • Data Processing
  • Diagrams
  • Dilatometers
  • Electronics
  • Frequency
  • Interferometers
  • Logic Gates
  • Materials
  • Materials Science
  • Measurement
  • Photodetectors
  • Signal Processing
  • Square Waves
  • Temperature Gradients
  • Vacuum Chambers

Fields of Study

  • Physics

Readers

  • Analytical Mechanics
  • Image Processing and Computer Vision.
  • Materials Science and Engineering.

Technology Areas

  • Directed Energy