Crack Propagation in Z5U Multilayer Dielectrics.
Abstract
It has been found that moisture has a deleterious effect in enhancing slow crack growth in Z5U multilayer ceramics similar to the effect shown in other ceramic materials. The enhancement of slow crack growth in the presence of moisture has been demonstrated for both parallel and perpendicular orientations of the multilayer structure with respect to the propagating crack. The application of DC electric fields to the multilayer ceramics either has no effect or serves to retard crack propagation depending upon the crack orientation with respect to the applied electric field. The fracture toughness or critical stress intensity factor as measured by the double torsion testing technique has been found to vary with respect to orientation of the multilayer structure. Higher fracture toughness values are obtained when the macroscopic crack is forced to propagate in a direction perpendicular to the multilayer structure.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1985
- Accession Number
- ADA159262
Entities
People
- B. G. Koepke
- K. D. Mchenry
Organizations
- Honeywell International, Inc.