X-Ray Scattering from Poly(thiophene): Crystallinity and Crystollography Structure.

Abstract

X-ray scattering has been used to investigate the crystallinity and crystal structure of chemically coupled polythiophene. Heat treatment at elevated temperatures leads to significant increases in crystallinity (from approx. 35% as-synthesized up to approx. 56% after annealing at 380 C for 30 minutes) and coherence length indicative of chain growth and extension. Chemical analysis of the chain extended PT shows a major reduction in residual iodine content consistent with growth of the polymer chains to approximately 1200 thiophene rings. An initial model of the crystal structure of polythiophene is presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1985
Accession Number
ADA159895

Entities

People

  • A. J. Heeger
  • K. B. Lee
  • Marcelo H. Kobayashi
  • Y. B. Moon
  • Z. Mo

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Annealing
  • California
  • Chemical Analysis
  • Conductive Polymers
  • Crystal Structure
  • Crystals
  • Diffraction
  • Heat Treatment
  • Macromolecules
  • Materials
  • Molecular Weight
  • Polymers
  • Radiation
  • Residuals
  • Scattering
  • X Ray Scattering
  • X Rays

Readers

  • Polymer Science and Technology
  • Semiconductor Device Technology