Interface Chemistry of Ternary Semiconductors: Local Morphology of the Hg(1-x)CdxTe-Cr Interface.

Abstract

Synchrotron Radiation Photoemission studies of interfaces prepared in situ on cleaved substrates show atomic interdiffusion with Cr/Hg and Cr/Cd exchange reactions taking place at room temperature for Cr coverages less than 2A. Correspondingly, dissociated Te is released at the surface. A subsurface region 10-13 A thick is formed in which Cr atoms replace all of the Hg atoms and at least 20% of the Cd atoms. Below this subsurface the semiconductor maintains the bulk stoichiometry and the initial surface band bending. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 15, 1985
Accession Number
ADA161034

Entities

People

  • A. Franciosi
  • D. J. Peterman
  • P. Philip

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Band Spectra
  • Chemical Engineering
  • Chemistry
  • Compound Semiconductors
  • Detectors
  • Electronics
  • Energy Bands
  • Exchange Reactions
  • Fermi Levels
  • Infrared Detectors
  • Materials
  • Materials Science
  • Military Research
  • Semiconductors
  • Solid State Physics
  • Synchrotron Radiation

Fields of Study

  • Materials science

Readers

  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene