Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.

Abstract

We started the project by initiating a study of available literature that is related to the scope of work for this project. Testing of high complexity LSI and VLSI components has become very important, and has been receiving considerable interest. The project involves a test-effectiveness measure. Because of the complexity of the problem, it has not yet been satisfactorily approached by others. Some work on information theoretic approach has been reported, but the approach does not appear to be suitable for testing digital system with high fault coverage. We feel that test-effectiveness measure should be related with physically possible failures, and thus the measure should be available to use detailed information of the circuitry if it is available.

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Document Details

Document Type
Technical Report
Publication Date
Aug 06, 1982
Accession Number
ADA161926

Entities

People

  • Stephen Y. H. Su
  • Y. K. Malaiya

Organizations

  • State University of New York at Albany

Tags

Communities of Interest

  • Air Platforms
  • Autonomy

DTIC Thesaurus Topics

  • Contractors
  • Contracts
  • Fault Tolerant Computing
  • Information Theory
  • Instruction Set Architecture
  • Instructions
  • Integrated Circuits
  • Language
  • Literature
  • Microcode
  • Microprocessors
  • New York
  • Sequences
  • Software Testing

Readers

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  • Systems Analysis and Design
  • Theoretical Analysis.