Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.

Abstract

This paper presents a number of algorithms to test the instruction decoding function of microprocessors based on some timing and control information available to users. Keywords: Register Transfer Language; Digital Networks.

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Document Details

Document Type
Technical Report
Publication Date
Feb 08, 1983
Accession Number
ADA161928

Entities

People

  • Stephen Y. H. Su

Organizations

  • State University of New York at Albany

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Computer Science
  • Computers
  • Decoding
  • Demographic Cohorts
  • Fault Tolerant Computing
  • Instructions
  • Language
  • Microprocessors
  • New York
  • Test Sets
  • Universities

Readers

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