Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.
Abstract
Microprocessor is a type of complex sequential machine. The current approach is to test microprocessor by instruction execution. Generally, before executing an instruction-under-test, we have to write certain data into some registrers, and after executing the instruction, we have to read the contents of the registers. Therefore, if the write or read instruction is faulty, we may not be able to test the instruction-under-test. To solve this problem, Thatte and Abraham have to label instructions and define test order in detail before testing. In addition, they do not consider the partial execution of an instruction. So one of the instruction decoding faults I(j)/I(j)+I(k) is assumed that, instead of executing I(j), both insructions I(j) and I(k) are executed to completion. This raises the problem of practicality. Abraham and Packer's method is simple, but their 'register read' test procedure does not guarantee the correctness of write and read register functions for any data. In our work, we consider the write and read register function as a kernel of a microprocessor; similar to a sequential machine, and we use the checking experiment to verify the kernal based on the fault models. Then we use the kernal for testing other instructions. Our approach consists of three steps: Step 1: Establish the fault model for representing functional faults, Step 2: Determine the requirement for test generation, and Step 3: Based on the requirements, develop testing mprocedures.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 03, 1983
- Accession Number
- ADA161929
Entities
People
- Stephen Y. H. Su
Organizations
- State University of New York at Albany