Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.

Abstract

This paper presents a method for functional testing of microprocessors. First, we develop a control fault model at the RTL (Register Transfer Language) level. Based on this model, we establish testing requirements for control faults. We present three test procedures to verify the write and read sequences and use the write and read sequences to test other instructions in a microprocessor. By utilizing k-out-of-m codes, we can use fewer tests to cover more faults, thereby reducing the test generation time. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Nov 03, 1983
Accession Number
ADA161930

Entities

People

  • Shen Li
  • Stephen Y. H. Su

Organizations

  • State University of New York at Albany

Tags

DTIC Thesaurus Topics

  • Arithmetic
  • Coding
  • Computer Programming
  • Computer Science
  • Computers
  • Coverings
  • Data Processing
  • Data Storage Systems
  • Data Transmission
  • Decoding
  • Demographic Cohorts
  • Instruction Set Architecture
  • Language
  • Microprocessors
  • New York
  • Notation
  • Processing Equipment

Fields of Study

  • Computer science

Readers

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  • Integrated Circuit Design and Technology.