Determination of Electronic and Atomic Structural Parameters during Fast Ion Transport.

Abstract

X-ray absorption spectroscopy was used to determine the valence state and local structure in a vanadium bronze and a tungsten bronze series of fast ion conducting materials. The structure parameters confirm previous x-ray diffraction results; however, the direct determination of valence state(s) is a unique result. X-ray methods appear to offer real advantages for in situ characterization. X-ray absorption spectroscopy is able to single out each different kind of element in a complex material because the core-level absorption edges are well separated in energy. The region near the absorption edge, x-ray absorption near edge structure (XANES) contains information on the valence state and local symmetry of the absorbing atom. The extended x-ray absorption fine structure (EXAFS) above the absorption edge is caused by scattering of the ejected photoelectron and may be used to determine near neighbor structural parameters.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1985
Accession Number
ADA161977

Entities

People

  • F. W. Lytl
  • T. R. Beck

Organizations

  • General Electric

Tags

DTIC Thesaurus Topics

  • Absorption Spectra
  • Atoms
  • Detectors
  • Diffraction
  • Electrochemistry
  • Electrodes
  • Electromagnetic Spectra
  • Electrons
  • Elements
  • Materials
  • Metals
  • Radiation
  • Scattering
  • Spectra
  • Spectroscopy
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene