Investigations into the Origins of the Physical Structure of Thin Films.

Abstract

The random ballistic aggregation of atoms onto a surface under low adatom mobility conditions leads to clustering and evolution of growth cones from these random clusters. The connections between these basic physical processes and the resulting wide variety of thin film morphologies (both top surface and cross-section) are being made in an attempt to quantify morphology, nad ultimately properties. The research can be divided into four research thrust areas: 1. controlled film preparation; 2. morphological characterization of the resulting films; 3. image enhancement/quantification of micrographs of morphology; and 4. conceptual and computer modeling of the morphology. This report describes our progress in each of these areas. Originators supplied keywords include: Sputtering; Ion-assisted deposition; and Fratals.

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Document Details

Document Type
Technical Report
Publication Date
Oct 25, 1985
Accession Number
ADA162772

Entities

People

  • Russell Messier

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Computer Simulations
  • Engineering
  • Experimental Data
  • Geometry
  • Materials
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Measurement
  • Mechanics
  • Microscopy
  • New York
  • Silicon Carbide
  • Thin Films
  • Two Dimensional
  • United States

Readers

  • Thin Film Deposition Science.