Heavy-Ion Induced Single Event Upsets in a Bipolar Logic Device.

Abstract

Heavy ion test results for a bipolar logic device of moderate complexity are presented in this report. Such devices required the implementation of special techniques for testing circuits of varying upset sensitivity, and unlike similar MOS devices, present problems with test data interpretation. Keywords: Bipolar Schottky Circuit; Cosmic rays; Heavy ions; Microprocessor-Bit slice; Single event upset.

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Document Details

Document Type
Technical Report
Publication Date
Dec 30, 1985
Accession Number
ADA163117

Entities

People

  • David L. Chenette
  • Rokutaro Koga
  • Wojciech A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Accumulators
  • Air Force
  • Circuits
  • Computers
  • Corporations
  • Diffusion
  • Energy
  • Energy Transfer
  • Engineering
  • Geometry
  • Instrumentation
  • Logic
  • Logic Devices
  • Physical Properties
  • Simulations
  • Space Sciences
  • Transistors

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Semiconductor Device Technology
  • Space Exploration and Orbital Mechanics.