Schottky Barrier Surface Science.
Abstract
Thermal desorption mass spectrometry (TDMS) and X-ray photoelectron spectroscopy (XPS) are utilized to study GaAs(100) surfaces prepared by MBE and chemical etching. XPS results on the chemically etched GaAs samples revealed As present in GaAs and As(+3) in the form of As2O3. TDMS of both the chemically etched and MBE prepared GaAs showed several impurities such as H2, H2O, CO2 and CO. Also, the surface reactions of water and ammonia with atomically clean GaAs survaces are studied with XPS and TDMS. These results help identify possible contaminants that may interfere with GaAs device performance. Keywords: Thermal desorption mass spectrometry; X-ray photoelectron spectroscopy; Surface science; GaAS processing Surface reactions; Gallium arsenide (100); Hydrogen; Water; Carbon dioxide; Carbon monoxide; Arsenic oxides.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1985
- Accession Number
- ADA163574
Entities
People
- Patricia M. George
Organizations
- Aerojet Rocketdyne Holdings