The Effects of Arsine Pressure on the Compositions, Carrier Concentrations, Mobilities and Growth Rates of Epitaxial Layers of Ga(x)In(1-x)As Prepared by the VPE (Vapor-Phase Epitaxy)-Hydride Technique,

Abstract

The effect of three arsine partial pressure on the preparation of the ternary, Ga(x)In(1-x)As, was investigated. Operational parameters are given for the preparation of Ga(0.47)In(0.53)As at these pressures. Increased arsine partial pressures decreased the gallium composition of the ternary. Growth rates have been determined as a function of gallium monochloride and arsine partial pressures. Increased mole fractions of arsine do not lower carrier concentrations or increase mobilities of the Ga(x)In(1-x)As layers. Keywords include: Vapor-Phase Epitaxy, Ga(x)In(1-x)As, and III-V Semiconductors.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1985
Accession Number
ADA165278

Entities

People

  • David W. Weyburne
  • Kenneth P. Quinlan

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystal Growth
  • Crystals
  • Elements
  • Epitaxial Growth
  • Field Effect Transistors
  • Flow Rate
  • Gas Flow
  • Mass Flow
  • Mobility
  • Molecular Beam Epitaxy
  • Partial Pressure
  • Phase
  • Quantum Wells
  • Semiconductors
  • Vapor Phases
  • Vapor Pressure

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene