Acta Optica Sinica (Selected Articles),

Abstract

Contents: The Second National Conference On Basic Optics and the Technical Committee Meeting on Basic Optics Held at Jungbo Lake; and The Inhomogeneity of the Optical Thin Film Determined by Real Time Elliptic Polarization Measurement. Abstract: An automatic photometric ellipsometer with rotating-analyzer is used in our vacuum thin film coater. This ellipsometer can measure the polarization of the depositing thin film instantly. The inhomogeneity of the refractive index can be analyzed from the path curve of the polarization parameters. Delta and Psi which vary with the thickness of the thin film. The experimental results show that both Zinc Sulfide and Zinc Selenide have about 100 A of inhomogeneous transition layers at the inner and outer boundaries. In the central region, it has homogeneous refractive index.

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Document Details

Document Type
Technical Report
Publication Date
Apr 04, 1986
Accession Number
ADA166281

Entities

People

  • Chunfei Li
  • Min Yi
  • Qihong Wu

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Birefringence
  • Boundaries
  • Compound Semiconductors
  • Cryolite
  • Ellipsometers
  • Experimental Data
  • Films
  • Intensity
  • Laser Spectroscopy
  • Lasers
  • Light Sources
  • Materials
  • Measurement
  • Optics
  • Refractive Index
  • Thin Films
  • Wave Mixing

Fields of Study

  • Physics

Readers

  • Spectroscopy.
  • Technical Research and Report Writing.
  • Thin Film Deposition Science.