Calculation of Single- and Double-Photon Free-Free Cross Sections for Electrons Scattered from HE, C, N, NE and AR.

Abstract

Calculations of cross sections for the free-free absorption of radiation by electrons scattered from atoms are reported. The results apply in the limit where theory is valid, and are obtained in the context of a realistic independent particle atomic model, which facilitates numerical solutions for both perturbed and unperturbed wave functions. Both one photon and two photon absorptions are analyzed, the latter in a mixed gauge representation. The method is applied to several different atomic targets--the ground states of He, for frequencies corresponding to the 3S1 and 1So states of He, for frequencies corresponding to the carbon dioxide, neodymium, and ruby lasers. The low-frequency results agree well with the soft-photon approximation, while, as one might expect, the numbers at shorter wavelengths diverge. For all cases, it was found that the free-free cross sections were negligibly small compared to radiationless cross sections, for intensities no greater than 1000000 W/cc. Keywords: Electron scattering; Free-free radiation; Perturbation theory; Frequency dependence.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1986
Accession Number
ADA167019

Entities

People

  • Edward J. Robinson

Organizations

  • New York University

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Absorption Cross Sections
  • Air Force
  • Bessel Functions
  • Birds
  • Electron Energy
  • Electron Scattering
  • Ground State
  • Metastable State
  • New York
  • Perturbations
  • Photon Cross Sections
  • Radiation
  • Ruby Lasers
  • Scattering
  • Security
  • United States
  • Wave Functions

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics
  • Plasma Physics / Magnetohydrodynamics
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics