Laser Photodeposition and Etching Study.
Abstract
The focus of the current research has been to employ an algebraic approach for studying the reliability of systems that can be modeled as networks. This approach has not only unified certain theoretical aspects of network reliability problems but has also suggested a number of new algorithms for calculating reliability measures. Based on this approach, both exact and approximate computational schemes have been developed, together with supporting data structures for implementing the necessary computations in an efficient manner. Empirical studies have also been designed and carried out to judge the computational merits of the various data structures. In order to increase the applicability of these research results, models have been investigated that allow the incorporation of dependent failure modes. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 07, 1985
- Accession Number
- ADA167179
Entities
People
- Douglas R. Shier
Organizations
- Clemson University