Structural Instabilities, Impurities and Defects in Electronic Materials.
Abstract
The research supported under the present contract has been directed toward an understanding of some basic optical properties in materials of potential importance to the development of electronic devices. One important class of materials studied has been thin films of III-V semi-conductors which are grown using organometallic transport gases. These materials have been investigated using both individual layers and multiple-layer structures. In the layer structures, some effects due to the quantum confinement of electrons have been studied. A second class of materials studied has been amorphous semiconductors. In this class of solids we have investigated diffusion of impurities in oxide glass and amorphous silicon films. Research has also been performed on the effects of light on the optical and structural properties of thin layers of chalcogenide glasses.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 14, 1985
- Accession Number
- ADA167272
Entities
People
- P. C. Taylor
Organizations
- University of Utah