Fourier Transform Infrared Spectroscopic Study of Aging in Commercial Polyurethane
Abstract
Satellite electronics systems may function for years before failing as a result of a shorted-out components. If the insulation is considered to be perfectly inert, then such failures would be inexplicable in terms of events intrinsic to the material. However, many physical and chemical changes may occur in the dielectric prior to breakdown. Hence, a polymer dielectric is not inert and may be more accurately thought of as a seething molecular and electronic cauldron, which gradually drifts in the direction of diminished resistance to applied electrical stress. After a time, which appears indefinite only because we have not adequately characterized the system, the constant electrical stress shorts out the degraded insulation. A correlation between decreases in infrared absorbance, molecular motion, electronic energy transfer, and increasing susceptibility to electric stress is supported by the data presented here. It is suggested that the development of new, voltage-stabilized materials can be greatly facilitated by using Fourier transform infrared spectroscopy (FTIR) as a diagnostic tool, and thermal aging as an accelerated aging test. Keywords: Electrical insulation; Encapsulation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 28, 1986
- Accession Number
- ADA167418
Entities
People
- Gail A. Cagle
- Robert S. Bretzlaff
- Sherrie L. Zacharius
- Stephen L. Sandlin
Organizations
- The Aerospace Corporation