Testing Methods for Integrated Circuit Chips.

Abstract

Provision for the functional testing of fabricated VLSI chips frequently involves as much design effort as the original chip design itself. Often the hardware requirements for testing involve a large expense. This research investigates the logical and functional requirements for chip testing. Available approaches are examined and their capabilities noted. Methods of communication between the test controller and the device under test are examined as well as logical structure of the test controller. Two candidate approaches are selected for comparison. (1) A standard general-purpose processor with standard bus interface serves as the test controller and (2) a custom VLSI test controller interfacing directly to the device under test. As a result, a test system architecture is proposed.

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Document Details

Document Type
Technical Report
Publication Date
Mar 27, 1986
Accession Number
ADA167932

Entities

People

  • Zafer Betoner

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Autonomy

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Computer Programming
  • Computer Programs
  • Computer-Aided Design
  • Computers
  • Digital Circuits
  • Engineering
  • Integrated Circuits
  • Logic Gates
  • Operating Systems
  • Simulations
  • Simulators
  • Standards
  • Test Equipment
  • Test Methods

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design