Electron Tunneling Microscopy.
Abstract
Within the past few years a new technique for surface studies has been introduced by researchers at the IBM Research Laboratory in Zurich, Switzerland which is capable of atomic resolution. This method, called Scanning Tunneling Microscopy (STM), involves positioning a probe a few angstroms from the surface of interest using a piezoelectric ceramic. A small potential is applied across the gap and the electron tunneling current is measured. The probing tip is then scanned across the surface in two dimensions also using piezoelectric ceramics while adjusting the distance between the tip and surface to maintain a constant current. In this way the tip is made to follow the contours of the surface. The resolution obtained in this way is about 3A in the surface plane, and 0.1 A normal to the surface.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 20, 1986
- Accession Number
- ADA168234
Entities
People
- John D. Baldeschwieler
Organizations
- California Institute of Technology