Stable Crack Growth in Aluminum Tensile Specimens.

Abstract

Post's white light moire interferometry was used to obtain sequential records of the transient u sub y-displacement fields associated with stable crack growth in 7075-T6 and 2024-O, single edge notched (SEN) specimens with fatigued cracks. The u sub y-displacement fields were used to evaluate the crack tip opening displacement (CTOD), far and near-field J-integral values, Dugdale strip yield model, William's polynomial function and the HRR fields.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1986
Accession Number
ADA170299

Entities

People

  • Albert S. Kobayashi
  • B. S. Kang
  • D. Post

Organizations

  • University of Washington

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Aluminum
  • Contour Integrals
  • Crack Tips
  • Cracks
  • Engineering
  • Far Field
  • Hardening
  • J Integrals
  • Light Sources
  • Materials
  • Mechanical Engineering
  • Mechanics
  • Near Field
  • Polynomials
  • Stress Intensity Factors
  • Two Dimensional
  • White Light

Readers

  • Materials Science (Mechanical Engineering).