Studies of Chain Conformational Kinetics in Poly(Di-n-Akylsilanes) by Spectroscopic Methods. 2. Conformation and Packing of Poly(Di-n-Hexylsilane),
Abstract
Unoriented and highly oriented films of poly(di-n-hexylsilane) have been studied by Raman scattering, wide angle X-ray diffraction and optical absorption measurements. From a comparison of group theoretical predictions with those bands observed in the Raman experiments and from the X-ray layer line spacing in an oriented sample, a planar zig-zag conformation for the silicon backbone was deduced. X-ray reflections were suitable indexed by a monoclinic unit cell containing two molecules. Polarized Raman studies on uniaxiallly oriented samples also revealed that the hexyl side chains are not orthogonal to the silicon backbone but may be slightly titled in order to minimize intramolecular steric interactions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 07, 1986
- Accession Number
- ADA170690
Entities
People
- B. L. Farmer
- H. Kuzmany
- J. F. Rabolt
- R. D. Miller
Organizations
- International Business Machines Corporation (Armonk, NY)