Intrinsic Mechanisms of Multi-Layer Ceramic Capacitor Failure.

Abstract

It has been established that the dominant charge carrier of leakage current in the BaTi03 based X7R ceramic that we have measured is the electron. Galvanic cell measurements yield oxygen ion transport numbers of essentially zero. The major effect of oxygen movement is not ionic current, but degradation. A generic degradation current-time curve is discussed. Two models for leakage current vs time are presented: one based on oxygen vacancy (and conduction electron) increase; the other on grain boundary barrier height reduction. Both predict exponential or near-exponential increase of leakage current with time, which has been reported. Reasons for the decrease in activation energy with degradation are discussed. This is attributed to decrease in polaron hopping or grain boundary potentials, or both.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1986
Accession Number
ADA171678

Entities

People

  • L. C. Burton

Organizations

  • Virginia Tech

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ceramic Capacitors
  • Ceramic Materials
  • Charge Carriers
  • Dielectric Permittivity
  • Electrical Properties
  • Electrochemical Cells
  • Electronic Components
  • Electrons
  • Energy
  • Fermi Levels
  • Grain Boundaries
  • Grain Size
  • Heat Of Activation
  • Impedance
  • Materials
  • Measurement
  • Semiconductors

Readers

  • Electrical Engineering
  • Materials Science and Engineering.
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics