Techniques of Microprocessor Testing and SEU (Single Event Upset)-Rate Prediction.

Abstract

Several different approaches have been used in the past to assess the vulnerability of microprocessors to SEU. In this report we discuss the advantages and disadvantages of each of these test methods, and address the question of how the microprocessor test results can be used to estimate upset rate in space. Finally, as an application of the above techniques, we present the test results and predicted upset rates in synchronous orbit for a selected group of microprocessors.

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Document Details

Document Type
Technical Report
Publication Date
Aug 15, 1986
Accession Number
ADA173176

Entities

People

  • Michael T. Marra
  • Rokutaro Koga
  • Wojciech A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Circuit Analysis
  • Circuits
  • Computer Programming
  • Computers
  • Computing System Architectures
  • Data Analysis
  • Databases
  • Dynamic Tests
  • Frequency
  • Instruction Set Architecture
  • Ions
  • Logic
  • Simulations
  • Space Sciences
  • Standards
  • Test Methods

Fields of Study

  • Physics

Readers

  • Atmospheric Science/Meteorology
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Space Exploration and Orbital Mechanics.

Technology Areas

  • Space