Automatic Microwave Semiconductor Device Testing.

Abstract

During the past three months, the project team has focused on; (1) analyses of type I, II, and III device characteristics; (2) definition of device measurement parameters using minimum number of test fixtures; (3) selection of the system computer and operating system.

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Document Details

Document Type
Technical Report
Publication Date
Oct 25, 1985
Accession Number
ADA173423

Entities

People

  • Chi-bong Lok

Organizations

  • Harris Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Amplifiers
  • Beam Leads
  • Bipolar Junction Transistors
  • Capacitance
  • Computers
  • Corporations
  • Diodes
  • Electronics Industry
  • Field Effect Transistors
  • Impatt Diodes
  • Industrial Preparedness
  • Manufacturing
  • Operating Systems
  • Pin Diodes
  • Semiconductor Devices
  • Semiconductors
  • Test Fixtures

Readers

  • Aerospace Test and Evaluation
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems