Automatic Microwave Semiconductor Device Testing.

Abstract

During the past three months the project team has focused efforts in the following areas: Customer/Contractor Meeting, Measurement Techniques Investigation, Software Design Investigation, Testing Flow Chart, Computer Simulations, Preliminary Switch Design, and ECP Formalization/Generation.

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Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1986
Accession Number
ADA173425

Entities

People

  • Chi-bong Lok
  • Edward A. Whitman

Organizations

  • Harris Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Analyzers
  • Bipolar Junction Transistors
  • Computer Simulations
  • Computers
  • Databases
  • Electronics
  • Manufacturing
  • Measurement
  • Modules (Electronics)
  • Power Electronics
  • Power Gain
  • Resource Management
  • Semiconductor Devices
  • Semiconductors
  • Simulations
  • Software Design
  • Transistor Amplifiers

Fields of Study

  • Engineering
  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics