Automatic Microwave Semiconductor Device Testing.

Abstract

During the past three months the project team has focused efforts in the following areas: Test Station Facility Layout, Computer System Integration, Project Preliminary Design Review, Switch Interface/Controller Design, Hardware Family Tree Documentation, Measurement Techniques Investigation, and Proposal Formalization.

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Document Details

Document Type
Technical Report
Publication Date
Sep 02, 1986
Accession Number
ADA173426

Entities

People

  • Chi-bong Lok

Organizations

  • Harris Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Bar Codes
  • Computers
  • Data Transmission
  • Engineering
  • Industrial Preparedness
  • Instrumentation
  • Manufacturing
  • Mass Storage
  • Measurement
  • Monitors
  • New York
  • Notation
  • Semiconductor Devices
  • Semiconductors
  • Site Selection
  • Sites
  • Systems Engineering

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems