A Description of the Failure Distributions of Selected Minuteman III Guidance System Electronic Cards.
Abstract
This research described the failure distributions of selected Minuteman III guidance electronic cards and was the first attempt to use the Total Time on Test graphical technique to detect failure patterns. The data analysis was performed by using a Zenith 100 computer program that performed the Total Time on Test calculations and the Reliability Data Acquisition and Analysis Techniques software package. The objective of the research were to 1) describe the failure distributions of selected Minuteman III electronic cards, 2) determine if the corresponding hazard function demonstrated infant mortality, useful life, or wearout, and 3) suggest management strategies to deal with wearout or infant mortality. Five individual cards were selected and the first three lifetimes of each card were examined. Nine of the fifteen cards indicated an exponential failure distribution, the other six were identified as either a Weibull or a normal failure distribution.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1986
- Accession Number
- ADA174313
Entities
People
- Albert E. Sisk
Organizations
- Air Force Institute of Technology