Reliability of Complex Devices in Random Environments.

Abstract

The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. The authors introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory conditions. The computations needed for randomly varying conditions are recursive and can be used for making decisions regarding maintenance and replacement. Keywords: multi-component devices; semimarkov processes.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1986
Accession Number
ADA174953

Entities

People

  • E. Cinlar
  • S. Ozekici

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Civil Engineering
  • Climate Change
  • Computations
  • Differential Equations
  • Distribution Functions
  • Engineering
  • Equations
  • Maintenance
  • Markov Chains
  • Markov Processes
  • New Jersey
  • Probability
  • Random Variables
  • Reliability
  • Security
  • Semimarkov Processes
  • Stochastic Processes

Readers

  • Adaptive Control and Estimation with Uncertainty in Dynamic Systems.
  • Computational Modeling and Simulation
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.