Mission Reliability Model Users Guide.
Abstract
The Mission Reliability Model (MIREM) has been developed to evaluate the reliability and sustained operating capability of advanced electronic circuits during the early stages of development. MIREM is applicable to integrated systems that achieve fault tolerance through dynamic fault detection, fault isolation, and reconfiguration. This program can also be valuable in evaluating designs that make use of 'hard wired' or 'brute force' redundancy. The most unique feature of MIREM is its ability to accurately reflect the impact of reconfigurable, competing functions on system reliability. The user defines the resources necessary to support a required function (e.g., Identify Friend/Foe, IFF), and the model will compute the probability of losing that functional capability over a certain operating time. A critical failure occurs when there are not a sufficient number of working resources to support a certain function. As an analytic model, MIREM determines a specific value for Mean Time Between Critical Failure, Mission Completion Success Probability, and Failure Resiliency. This report documents the latest enhancements added to MIREM. The model can now calculate the effects of undetected failures and false alarms upon system reliability. Mean Time Between Maintenance Action and Mean Time to Repair are two output statistics which have been added. Graphical outputs, now included with MIREM, illustrate repair options for circuits where reliability gracefully degrades over a period of time. Keywords: Computer program documentation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1986
- Accession Number
- ADA175235
Entities
People
- Michael H. Veatch
- Robert K. Gates
Organizations
- TASC, Inc