SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

Abstract

A detailed analysis of the SEU vulnerability of the Zilog Z-80 microprocessor is presented based upon data obtained with heavy ions and protons. The analysis demonstrates a method for separating upsets of the general purpose registers from upsets of the internal latches. Furthermore, the analysis shows that the bulk of the upsets observed below a LET value of 4 MeV-sq cm/mg is associated with upset of these internal latches. To obtain the data which made this analysis possible, a novel test technique was developed which associates all upsets with the machine cycle during which they first appear on the device pins. Limited data for the NCS-800 are included.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1986
Accession Number
ADA176094

Entities

People

  • C. King
  • J. Cusick
  • Rokutano Koga
  • W. A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Artificial Intelligence
  • Chemical Kinetics
  • Chemical Reactions
  • Chemistry
  • Compound Semiconductors
  • Computers
  • Cosmic Rays
  • Energy
  • Energy Transfer
  • Materials
  • Materials Science
  • Physics Laboratories
  • Security
  • Semiconductor Devices
  • Space Sciences
  • Space Systems
  • Test Methods

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Integrated Circuit Design and Technology.
  • Solar Physics