Computer Simulation of Deterioration by Electromigration.

Abstract

Analysis of electromigration and redistribution of material in grain boundaries has been programmed for simulation of these processes in relatively realistic grain boundary networks generated from computer generated Voronoi networks. Realism is improved by simulation of annealing prior to simulation of electromigration. Keywords include: Electromigration and Simulation.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1986
Accession Number
ADA176136

Entities

People

  • H. B. Huntington
  • Shahzad Ahmad

Organizations

  • Rensselaer Polytechnic Institute

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Availability
  • Boltzmann Equation
  • Boundaries
  • Classification
  • Computer Simulations
  • Computers
  • Diffusion
  • Equations
  • Films
  • Grain Boundaries
  • Literature Surveys
  • Materials
  • Security
  • Simulations
  • Thin Films

Fields of Study

  • Engineering

Readers

  • Computational Fluid Dynamics (CFD)
  • Thin Film Deposition Science.