SEU (Single Event Upset) Tolerance of McDonnell Douglas' CMOS/SOS High Performance 3 Chip Implementation of MIL-STD-1750A Instruction Set.

Abstract

A single event upset (SEU) experiment was conducted on the control unit (CU) chip of McDonnell Douglas' 1750A microprocessor (called the MD281), as a joint effort of McDonnell Douglas Corporation and The Aerospace Corporation at the 88 inch cyclotron, Lawrence Berkeley Laboratory. No upset was detected using a 140 MeV krypton beam. Test results, geometry, and process parameters are used to predict a failure threshold and an upset rate. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1986
Accession Number
ADA176234

Entities

People

  • G. W. Robnett
  • J. D. Vantrease
  • Rokutano Koga
  • W. A. Hanna
  • W. A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Acquisition
  • Air Force
  • Buildings And Structures
  • Classification
  • Computers
  • Corporations
  • Data Acquisition
  • Energy Levels
  • Geometry
  • Instruction Set Architecture
  • Microcode
  • Microprocessors
  • Radiation
  • Research Facilities
  • Security
  • Space Sciences
  • Space Systems

Fields of Study

  • Physics

Readers

  • Aerospace Engineering
  • Integrated Circuit Design and Technology.
  • Technical Research and Report Writing.

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  • Space