Cosmic Ray Effects on Microelectronics. Part 4

Abstract

Single Event Upset (SEU) vulnerability must be considered in the design of all modern digital electronic systems for use in space. This has resulted in a need to accurately estimate the SEU rate for each type of digital microelectronic component used in the electronic system of any spacecraft on any orbit. This report presents a method of making such estimates. This method, considers the effects of device parameters, material shielding, orbital parameters, interplanetary weather conditions and solar activity. Keywords include: Soft upsets, Soft errors, Microelectronics; Cosmic rays; Propagation; Geomagnetic cutoff; and Single event upsets.

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Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1986
Accession Number
ADA176611

Entities

People

  • James H. Adams Jr.

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Apogees
  • Charged Particles
  • Computer Programs
  • Computers
  • Cosmic Rays
  • Elliptical Orbits
  • Galactic Cosmic Rays
  • Ionization
  • Materials
  • Nuclear Reactions
  • Orbital Inclination
  • Plastic Explosives
  • Shielding
  • Solar Activity
  • Solar Flares
  • Spacecraft
  • Spacecraft Orbits

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Regression Analysis.
  • Solar Physics

Technology Areas

  • Microelectronics
  • Space