Automatic Microwave Semiconductor Device Testing.

Abstract

During the past three months, the Automatic Microwave Semiconductor Device Tester (AMSDT) project team has focused efforts in the following areas: Test Station Work Area, Computer System Integration, Network Analyzer System, Switch Interface/Controller Fabrication, Major Hardware Status, AMSDT Front Panel Drawing Update, Informal Meeting with USACECOM, Test Strategy Formalization, Shared - Ha rdware Testing Scenario Considerations, and Program Schedule Revision.

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Document Details

Document Type
Technical Report
Publication Date
Feb 04, 1987
Accession Number
ADA177321

Entities

People

  • Edward A. Whitman

Organizations

  • Harris Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Analyzers
  • Automatic
  • Bar Codes
  • Calibration
  • Circuit Breakers
  • Computers
  • Databases
  • Engineering
  • Fabrication
  • Instrumentation
  • Manufacturing
  • Microwave Amplifiers
  • Microwaves
  • Semiconductor Devices
  • Semiconductors
  • Test Fixtures
  • Test Sets

Readers

  • Aerospace Test and Evaluation
  • Software Engineering
  • Software Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems