Molecular Beam Epitaxial Growth and Electrical and Optical Investigations of III-V Compound Semiconductors.

Abstract

A list of capital equipment acquired for updating the Perkin-Elmer 400 molecular beam epitaxial growth system and establishing capabilities for reflection high energy electron diffraction intensity dynamics, spectroscopic ellipsometry in the near Infrared regime, Hall mobility, capacitance voltage and current voltage measurements is provided, along with a description of the salient features of each of these systems. Keywords: Molecular Beam Epitaxy; Spectroscopic Ellipsometry; Photoluminescence; Hall Mobility.

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Document Details

Document Type
Technical Report
Publication Date
Dec 22, 1986
Accession Number
ADA177487

Entities

People

  • A. Madhukar

Organizations

  • University of Southern California

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • California
  • Compound Semiconductors
  • Computers
  • Control Systems
  • Detection
  • Detectors
  • Dynamics
  • Electrical Measurement
  • Epitaxial Growth
  • Instrumentation
  • Laminar Flow
  • Measurement
  • Molecular Beams
  • Pressure Regulators
  • Schematic Diagrams
  • Semiconductors
  • Vacuum

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics