Application of Nondestructive Testing Techniques to Materials Testing.
Abstract
During the last year, we finished our electronic imaging. We have developed an new type of acoustic microscope which is capable of measuring both the phase and amplitude of an acoustic wave. With this system, we have been able to measure the thickness of films of a few thousand Angstroms thick using a 50 MHz microscope with an acoustic wavelength in water of 30 microns. An interesting feature has been that we can now measure the amplitude and phase of the V (z) curves (the variation in the amplitude of the signal received at the microscope determined as a function of the distance z of the surface of the solid object from the focus). The two papers on this subject to be published in the IEEE Ultrasonic Transactions in April 1985 form part of the appendix of this report. During the year we have begun to work on a new type of scanning optical microscope which used a Bragg cell to scan an otptical beam. Early results indicate that we can measure the thickness of transparent and opaque films to high accuracies.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1984
- Accession Number
- ADA177950
Entities
People
- Gordon S. Kino
Organizations
- Stanford University