J-Resistance Curves in Aluminum SEN (Single-Edged Notch) Specimens.
Abstract
The (y)-displacement fields obtained by white-light moire interferometry were used to estimate the approximate far- and near-field J-integral values associated with the subcritical crack growths in fatigue precracked 7075-T6 and blunt notched and fatigue precracked 2024-0 and 5052-H32 aluminum, single-edged notch (SEN) specimens. The initial phases of the J-resistance curves for the somewhat brittle 7075-T6 and the two ductile 2024-0 an 5052-H32 aluminum SEN specimens are presented. (Keywords: aluminum, crack growth).
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1987
- Accession Number
- ADA178166
Entities
People
- Albert S. Kobayashi
- B. S. Kang
Organizations
- University of Washington