New Methods for Recording and Processing High Frequency Moire Patterns,

Abstract

Two techniques for enhancing the potential of high frequency moire interferometry are investigated. A high frequency Ronchi grating is transferred from a suitably processed silicon wafer to a test specimen. Results indicate that the grating can be used to vary sensitivity, and that gratings of nearly any shape and size can be deposited on the surface of specimen. Further work is suggested to refine the technique. In addition, an automated approach for measuring surface displacement using moire interferometry is described. The method relies on the introduction of a carrier fringe pattern to achieve fringe linearization, and the application of image digitization and computer analysis to determine the magnitude and direction of a specific displacement component. (Reprint)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1987
Accession Number
ADA178739

Entities

People

  • Donald R. Matthys
  • Helen S. Johnson
  • J. A. Gilbert
  • James H. Bennewitz
  • T. D. Dudderar

Organizations

  • University of Alabama in Huntsville

Tags

Communities of Interest

  • Advanced Electronics
  • Engineered Resilient Systems

DTIC Thesaurus Topics

  • Acquisition
  • Artificial Intelligence
  • Classification
  • Computer Programs
  • Computer Vision
  • Diffraction
  • Excimer Lasers
  • Fibers
  • Frequency
  • Image Processing
  • Intensity
  • Lasers
  • Military Research
  • Photographic Plates
  • Photolithography
  • Recording Systems
  • Security

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Structural Health Monitoring of Composite Structures.