A User's Guide to the Picker Diffractometer for Polymer Morphology Studies

Abstract

The use of the Picker Automated Four-circle X-Ray Diffractometer System for Polymer Morphology studies is explained and illustrated. Operations of the instrument, selection of experimental parameters, and specific methods for the following analyses are presented: crystallite size, orientation factors (with resolved or overlapped reflections), alyer line intensity scan, and full pole figures.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1986
Accession Number
ADA180217

Entities

People

  • Joseph F. O'brien
  • P. G. Lenhert
  • W. W. Adams

Organizations

  • Vanderbilt University

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Composite Materials
  • Computer Programs
  • Crystal Structure
  • Crystals
  • Detectors
  • Diffraction
  • Geometry
  • Magnetic Tape
  • Materials
  • Materials Laboratories
  • Measurement
  • Polycrystals
  • Radiation
  • Standards
  • Two Dimensional
  • X Rays
  • X-Ray Diffraction

Readers

  • Nanofabrication and Microfabrication.
  • Systems Analysis and Design