DLTS Analysis and Modeling of Electron and Proton Irradiated (AlGa)As/GaAs Multijunction Solar Cells.
Abstract
A numerical model has been developed to calculate the displacement defects, the damage constant of minority carrier diffusion length and the degradation of short circuit current (I sub sc), open circuit voltage (V sub oc) and conversion efficiency (eta sub c) in the 1 MeV electron and proton irradiated AlGaAs/GaAs/InGaAs multijunction junction solar cell under normal incidence conditions. The results show good agreement between our calculated values and the experimental data of I sub sc, V sub oc and eta sub c. In addition, DLTS analysis of defects in AlGaAs p-n junction solar cells irradiated by 1-MeV electrons has also been carried out in this work. The I-V analysis on several MOCVD-grown Ge/GaAs tunnel junction diodes has also been made in this study. Keywords: Gallium Arsenide, Aluminum Gallium Arsenide; Idium Gallium Arsenide; Deep Level Transient Spectroscopy; Germanium; Radiation Defects; Multijunction Solar Cells; Tunnel Junctions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1987
- Accession Number
- ADA180234
Entities
People
- Shengsan Li
Organizations
- University of Florida