Task Learning Difficulty: Interrelationships Among Aptitude-Specific Benchmarked Rating Scales.

Abstract

In order to properly identify the nature of Air Force jobs, AFHRL developed survey-based technologies to investigate jobs at the task level. Task level. Task difficulty was one of the task factors examined. Separate 'benchmarked' rating scales were developed against which tasks could be compared for the Mechanical, Electronics, and General/Administrative aptitude areas. The scales were aptitude-specific, so ratings were not directly comparable for Air Force Specialties (AFSs) from different aptitude areas. This paper describes the interrelationships and creates a common reference scale. Each of the scales was used independently to rate representative taks for AFSs in all three aptitude areas and then simple regression, non-linear regression, and equipercentile equating analyses were performed on the raw data. The interrelationships generated were practically equivalent. Moreover, this equivalence was reinforced by rating data from a different source. Due to the statistical rigor of the non-linear regression model, it was chosen as the basis for comparing the scale properties and creating the single scale. The original scales were adjusted to reflect the interrelationships obtained, and differences in both scale ranges and intervals were found. The interrelationships allow existing data to be converted onto a common reference scale, and the single scale will allow future data to be immediately comparable across aptitude area boundaries. Keywords: Aptitude requirements; Job analysis; Occupational analysis; Task difficulty.

Document Details

Document Type
Technical Report
Publication Date
May 01, 1987
Accession Number
ADA180641

Entities

People

  • John D. Ramadge

Organizations

  • Air Force Research Laboratory

Tags

DTIC Thesaurus Topics

  • Air Force
  • Boundaries
  • Electronics
  • Intervals
  • Job Analysis
  • Learning

Readers

  • Instructional Design and Training Evaluation.
  • Psychometric Testing or Psychological Assessment.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems