Field Assisted Etching,

Abstract

We have investigated the effects of both high gravitational and electric fields on wet etching with the objective of inducing anisotropy in otherwise isotropic etch systems and of removing particulates. Although we achieved anisotropy when etching silicon in HNA and gallium arsenide in a phosphoric/sulphuric/peroxide etch in a high gravitational field, the results depended on the size and depth of the features, so we do not believe that this will be useful in standard semiconductor processing. The use of a large gravitational field did result in the removal of a substantial fraction of the particulates which are formed when etching aluminum/silicon/copper, and this may be technologically useful. We also found that the use of large gravitational fields was an effective tool for the identification of diffusion limited etch systems. The application of a high electric field to a prototype non-conducting etch system modified the etching and this effect could merit further investigation.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1986
Accession Number
ADA181037

Entities

People

  • J. A. Edwards
  • J. D. Benjamin

Organizations

  • Royal Signals and Radar Establishment

Tags

DTIC Thesaurus Topics

  • Aluminum
  • Cell Size
  • Cells
  • Cellular Structures
  • Dielectric Permittivity
  • Diffusion Coefficient
  • Electric Fields
  • Electron Microscopes
  • Electron Microscopy
  • Gallium Arsenides
  • Gravitational Fields
  • Materials
  • Microscopes
  • Scanning Electron Microscopes
  • Scanning Electron Microscopy
  • Silicon Dioxide
  • Surface Tension

Fields of Study

  • Materials science

Readers

  • Nanofabrication and Microfabrication.
  • Plasma Physics / Magnetohydrodynamics
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene