The Impact of VHSIC (Very High Speed Integrated Circuit) Technology on Automatic Test Systems.

Abstract

The primary output of this study contract as defined by the sponsoring organization is to determine a generic VHSIC ATS architecture for VHSIC-based Line Replaceable Modules (LRMs). This was accomplished by a systematic evaluation of all known factors impacting architecture considerations. A recommended architecture was formulated by combining VHSIC-based LRM characteristics (technology implementation, performance parameters and imposed standards) with ATS requirements (technology/test methods and test equipment standards). The VHSIC-based LRM survey, conducted as part of the contract workscope, has currently yielded data on a population of 29 LRM's. The survey information has been entered and compiled in the VHSIC ATS Knowledge Base. Querying the Knowledge using selected sort criteria (Appendix E) indicates a wide variety of implementations in both circuit complexity (MSI through VLSI) and processes (bipolar, CMOS, GaAS, etc.) to achieve LRM functions (VHSIC and non-VHSIC).

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Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1987
Accession Number
ADA181051

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  • Joseph G. Henderson

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  • Westinghouse Electric Corporation

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