Measuring and Modelling the Transition Layer during the Dissolution of Grassy Polymer Films.

Abstract

The technique of laser interferometry is now routinely used by the microelectronics industry for the measurement of the dissolution rates of thin polymer films. In addition to the rate of dissolution, laser interferometry can also provide quantitative information on the thickness of the transition layer between the dissolving glassy polymer and the liquid solvent. This paper describes how observed patterns of reflected light intensity may be analyzed to calculate the thickness of the transition layer for polymers that dissolve with little or no swelling. The technique required knowledge of the shape of the concentration profile in the transition layer. However, by assuming various simple model profiles one may obtain a reasonable estimate. Experimental measurements of PMMA films dissolving in methyl ethyl ketone weights M sub w = 37,000 to 1,400,000.

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Document Details

Document Type
Technical Report
Publication Date
May 29, 1987
Accession Number
ADA181168

Entities

People

  • Francisco J. Medellı́n-Rodrı́guez
  • P. D. Krasicky
  • R. J. Groele

Organizations

  • Cornell University School of Chemical and Biomolecular Engineering

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplitude
  • Chemical Engineering
  • Chemistry
  • Engineered Materials
  • Engineering
  • Engineers
  • Equations
  • Films
  • Interferometry
  • Materials
  • Materials Engineering
  • Materials Laboratories
  • Materials Science
  • Measurement
  • Military Research
  • Molecular Weight
  • Polymeric Films

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Polymer Science and Engineering.
  • Radar Systems Engineering.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene